學術論文
Impact of energy straggle on proton-induced single event upset test in a 65-nm SRAM cell Ye, Bing and Liu, Jie and Wang, Tie-Shan and Liu, Tian-Qi and Luo, Jie and Wang, Bin and Yin, Ya-Nan and Ji, Qing-Gang and Hu, Pei-Pei and Sun, You-Mei and others.2017
Low energy proton induced single event upset in 65nm DDR and QDR commercial SRAMs Ye, B and Liu, J and Wang, TS and Liu, TQ and Maaz, K and Luo, J and Wang, B and Yin, YN and Ji, QG and Sun, YM and others.Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms:2017
1.Impact of energy straggle on proton-induced single event upset test in a 65-nm SRAM cell Ye, Bing and Liu, Jie and Wang, Tie-Shan and Liu, Tian-Qi and Luo, Jie and Wang, Bin and Yin, Ya-Nan and Ji, Qing-Gang and Hu, Pei-Pei and Sun, You-Mei and others.2017
2.Low energy proton induced single event upset in 65nm DDR and QDR commercial SRAMs Ye, B and Liu, J and Wang, TS and Liu, TQ and Maaz, K and Luo, J and Wang, B and Yin, YN and Ji, QG and Sun, YM and others.Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms:2017
教育背景
•蘭州大學物理科學與技術學院,博士研究生 | 2014.9-2017.6
•中國科學院大學近代物理研究所,博士研究生 | 2014.9-2017.6
•中國科學院大學近代物理研究所,碩士研究生 | 2012.9-2015.6
•南昌大學高能研究院,本科 | 2008.9-2012.6